View ISL1209IU10Z-TK_777055.PDF datasheet online --- IC-ON-LINE

Datasheet File OCR Text:

1 ? fn6109.1 caution: these devices are sensitive to electrosta tic discharge; follow proper ic handling procedures. 1-888-intersil or 1-888-468-3774 | intersil (and design) is a registered trademark of intersil americas inc. copyright intersil americas inc. 2005. all rights reserved all other trademarks mentioned are the property of their respective owners. isl1209 real time clock/calenda r with event detection low power rtc with battery backed sram and event detection the isl1209 device is a low power real time clock with event detect function, timing and crystal compensation, clock/calendar, power fail indicator, periodic or polled alarm, intelligent battery backup switching and battery-backed user sram. note: the oscillator us es an external, low-cost 32.768khz crystal. the real time clock tr acks time with separate registers for hours, minutes, and seconds. the device has calendar registers for date, month, year and day of the week. the calendar is accurate through 2099, with automatic leap year correction. pinout isl1209 (10 ld msop) top view features ? real time clock/calendar - tracks time in hours, minutes, and seconds - day of the week, day, month, and year ? security and event functions - tamper detection with time stamp - event detection during battery packed or normal modes - selectable event input sampling rates allows low power operation - selectable glitch filter on event input monitor ? 15 selectable frequency outputs ? single alarm - settable to the second, minute, hour, day of the week, day, or month - single event or pulse interrupt mode ? automatic backup to battery or super cap ? power failure detection ? on-chip oscillator compensation ? 2 bytes battery-backed user sram ?i 2 c interface - 400khz data transfer rate ? 400na battery supply current ? small package -10 ld msop ? pb-free plus anneal available (rohs compliant) applications ? utility meters ? set top box/modem ? pos equipment ? network routers, hubs, switches, bridges ? cellular infrastructure equipment ? fixed broadband wireless equipment ? test meters/fixtures ? vending machine management ? security and anti tampering applications - panel/enclosure status - warranty reporting - time stamping applications - patrol/security check (fire or light equipment) - automotive applications ordering information part number part marking v dd range (v) temp range (c) package isl1209iu10* agt 2.7 to 5.5 -40 to 85 10 ld msop isl1209iu10z* (see note) anv 2.7 to 5.5 -40 to 85 10 ld msop (pb-free) *add ?-tk? suffix for tape and reel. note: intersil pb-free plus anneal products employ special pb-free material sets; molding compounds/die attach materials and 100% matte tin plate termination finish, which are rohs compliant and compatible with both snpb and pb-free soldering operations. intersil pb-free products are msl classified at pb-free peak reflow temperatures that meet or exceed the pb-free requirements of ipc/jedec j std-020. v dd irq /f out scl sda evdet x1 x2 v bat evin 1 2 3 4 5 10 9 8 7 6 gnd data sheet september 27, 2005
2 fn6109.1 september 27, 2005 block diagram i 2 c interface control logic alarm frequency out rtc divider sda buffer crystal oscillator por switch scl buffer sda scl x1 x2 v dd v bat irq / f out internal supply v trip seconds minutes hours day of week date month year user sram control registers evin evdet gnd pin descriptions pin number symbol description 1x1 x1. the x1 pin is the input of an inverting amplifier and is intended to be connected to one pin of an external 32.768khz quartz crystal. x1 can also be driven directly from a 32.768khz source. 2x2 x2. the x2 pin is the output of an inverting amplifier and is intended to be connected to one pin of an external 32.768khz quartz crystal. x2 should be left open when x1 is driven from external source. 3v bat v bat. this input provides a backup supply voltage to the device. v bat supplies power to the device in the event that the v dd supply fails. this pin shoul d be tied to ground if not used. 4gnd ground . 5evin event input ( evin ). the evin is an input pin that is used to detec t an externally monitored event. when a high signal is present at the evin pin an ?event? is detected. 6 evdet event detect output , active when evin is triggered. open drain output. 7sda serial data ( sda ). sda is a bidirectional pin used to transfer se rial data into and out of the device. it has an open drain output and may be wire or?ed with other open drain or open collector outputs. 8scl serial clock ( scl ). the scl input is used to clock all serial data into and out of the device. 9irq /f out interrupt output irq, / frequency output f out. multi-functional pin that can be used as interrupt or frequency output pin. the function is set via the configuration register. 10 v dd v dd. power supply. isl1209
3 fn6109.1 september 27, 2005 absolute m aximum ratings voltage on v dd , v bat , scl, sda, and irq pins (respect to ground) . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5v to 7.0v voltage on x1 and x2 pins (respect to ground) . . . . . . . . . . . .-0.5v to v dd + 0.5 (v dd mode) -0.5v to v bat + 0.5 (v bat mode) storage temperature . . . . . . . . . . . . . . . . . . . . . . . .-65c to +150c lead temperature (soldering, 10s) . . . . . . . . . . . . . . . . . . . . . 300c esd rating (human body model) . . . . . . . . . . . . . . . . . . . . . . >2kv caution: stresses above those listed in ?absolute maximum ratings? may cause permanent damage to the device. this is a stress o nly rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. dc operating characteristics ? rtc test conditions:v dd = +2.7 to +5.5v, temperature = -40 c to +85c, unless otherwise stated. symbol parameter conditions min typ (note 4) max units notes v dd main power supply 2.7 5.5 v v bat battery supply voltage 1.8 5.5 v i dd1 supply current v dd = 5v 2 6 a 1, 2 v dd = 3v 1.2 4 a i dd2 supply current with i 2 c active v dd = 5v 40 120 a 1, 2 i dd3 supply current (low power mode) v dd = 5v, lpmode = 1 1.4 5 a 1 i bat battery supply current v bat = 3v 400 950 na 1 i li input leakage current on scl 100 na i lo i/o leakage current on sda 100 na v trip v bat mode threshold 1.6 2.2 2.6 v v triphys v trip hysteresis 10 30 50 mv v bathys v bat hysteresis 15 50 100 mv evin v il -0.3 0.3 x v dd v v ih 0.7 x v dd v dd + 0.3 v hysteresis 0.05 x v dd v i evpu evin pullup current v sup = 3v 1.5 a 5 irq /f out and evdet v ol output low voltage v dd = 5v, i ol = 3ma 0.4 v v dd = 2.7v, i ol = 1ma 0.4 v power-down timing test conditions:v dd = +2.7 to +5.5v, temperature = -40c to +85c, unless otherwise stated. symbol parameter conditions min typ (note 4) max units notes v dd sr- v dd negative slew rate 10 v/ms 3 isl1209
4 fn6109.1 september 27, 2005 i 2 c interface specifications test conditions:v dd = +2.7 to +5.5v, temperature = -40c to +85c, unless otherwise specified. symbol parameter test conditions min typ (note 4) max units v il sda and scl input buffer low voltage -0.3 0.3 x v dd v v ih sda and scl input buffer high voltage 0.7 x v dd v dd + 0.3 v hysteresis sda and scl input buffer hysteresis 0.05 x v dd v v ol sda output buffer low voltage, sinking 3ma v dd = 5v, i ol = 3ma 0.4 v cpin sda and scl pin capacitance t a = 25c, f = 1mhz, v dd =5v, v in =0v, v out =0v 10 pf f scl scl frequency 400 khz t in pulse width suppression time at sda and scl inputs any pulse narrower than the max spec is suppressed. 50 ns t aa scl falling edge to sda output data valid scl falling edge crossing 30% of v dd , until sda exits the 30% to 70% of v dd window. 900 ns t buf time the bus must be free before the start of a new transmission sda crossing 70% of v dd during a stop condition, to sda crossing 70% of v dd during the following start condition. 1300 ns t low clock low time measured at the 30% of v dd crossing. 1300 ns t high clock high time measured at the 70% of v dd crossing. 600 ns t su:sta start condition setup time scl rising edge to sda falling edge. both crossing 70% of v dd . 600 ns t hd:sta start condition hold time from sd a falling edge crossing 30% of v dd to scl falling edge crossing 70% of v dd . 600 ns t su:dat input data setup time from sda exiting the 30% to 70% of v dd window, to scl rising edge crossing 30% of v dd. 100 ns t hd:dat input data hold time from scl falling edge crossing 30% of v dd to sda entering the 30% to 70% of v dd window. 0 900 ns t su:sto stop condition setup time from scl rising edge crossing 70% of v dd , to sda rising edge crossing 30% of v dd . 600 ns t hd:sto stop condition hold time from sda rising edge to scl falling edge. both crossing 70% of v dd . 600 ns t dh output data hold time from scl falling edge crossing 30% of v dd , until sda enters the 30% to 70% of v dd window. 0ns t r sda and scl rise time from 30% to 70% of v dd. 20 + 0.1 x cb 300 ns t f sda and scl fall time from 70% to 30% of v dd. 20 + 0.1 x cb 300 ns cb capacitive loading of sda or scl total on-chip and off-chip 10 400 pf rpu sda and scl bus pull-up resistor off- chip maximum is determined by t r and t f . for cb = 400pf, max is about 2~2.5k ? . for cb = 40pf, max is about 15~20k ? 1k ? notes: 1. irq & f out and evdet inactive. 2. lpmode = 0 (default). 3. in order to ensure proper timekeeping, the v dd sr- specification must be followed. 4. typical values are for t = 25c and 3.3v supply voltage. 5. v sup =v dd if in v dd mode, v sup =v bat if in v bat mode. isl1209
5 fn6109.1 september 27, 2005 sda vs. scl timing symbol table t su:sto t dh t high t su:sta t hd:sta t hd:dat t su:dat scl sda (input timing) sda (output timing) t f t low t buf t aa t r waveform inputs outputs must be steady will be steady may change from low to high will change from low to high may change from high to low will change from high to low don?t care: changes allowed changing: state not known n/a center line is high impedance isl1209
6 fn6109.1 september 27, 2005 vdd typical performance curves temperature is 25c unless otherwise specified figure 1. i bat vs v bat figure 2. i bat vs temperature at v bat = 3v figure 3. i dd1 vs temperature figure 4. i dd1 vs vdd with lpmode on & off figure 5. i dd1 vs f out at v dd = 3.3v figure 6. i dd1 vs f out at v dd = 5v 000e+0 100e-9 200e-9 300e-9 400e-9 500e-9 600e-9 700e-9 800e-9 900e-9 1e-6 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 v bat (v) i bat (a) 000e+0 200e-9 400e-9 600e-9 800e-9 1e-6 -40-200 20406080 temperature (c) i bat (a) 1.0e-06 1.2e-06 1.4e-06 1.6e-06 1.8e-06 2.0e-06 2.2e-06 2.4e-06 -40-200 20406080 temperature (c) i dd1 (a) v dd = 5v v dd = 3.3v 400.0e-9 600.0e-9 800.0e-9 1.0e-6 1.2e-6 1.4e-6 1.6e-6 1.8e-6 2.0e-6 2.2e-6 2.4e-6 2.53.03.54.04.55.05.5 v dd (v) lpmode = 0 lpmode = 1 i dd1 (a) 1.2e-6 1.3e-6 1.4e-6 1.5e-6 1.6e-6 1.7e-6 1.8e-6 1.9e-6 2.0e-6 2.1e-6 f out (hz) 1/8 2 8 32 1024 32768 1/2 1/32 1/16 1/4 1 4 16 64 4096 i dd1 (a) 1.8e-6 1.9e-6 2.0e-6 2.1e-6 2.2e-6 2.3e-6 2.4e-6 2.5e-6 2.6e-6 2.7e-6 2.8e-6 2.9e-6 3.0e-6 f out (hz) 1/8 2 8 32 1024 32768 1/2 1/32 1/16 1/4 1 4 16 64 4096 i dd1 (a) isl1209
7 fn6109.1 september 27, 2005 general description the isl1209 device is a low power real time clock with security and event function timing and crystal compensation, clock/calendar, power fail indicator, periodic or polled alarm, intelligent battery backup switching, and battery-backed user sram. the event detection function can be used for tamper detection, security or othe r chassis or generic system monitoring. upon a valid event detection, the isl1209 sets the event detection bit (evt bit) in the status register and, can optionally: 1) issue an event output signal (evdet pin), 2) at the time the event o ccurred, stop the rtc registers from advancing. the event monitor can function in both main v dd and battery back up modes. the event monitor can also be configured for various input detection rates to optimize power consumption for the applic ation. in addition, the event monitor pin (evin) has a selectable glitch filter to avoid switch de-bouncing. the oscillator uses an external, low-cost 32.768khz crystal. the real time clock tracks time with separate registers for hours, minutes, and seconds. the device has calendar registers for date, month, ye ar and day of the week. the calendar is accurate through 2 099, with automatic leap year correction. the isl1209's powerful alarm can be set to any clock/calendar value for a match. for example, every minute, every tuesday or at 5:23 am on march 21. the alarm status is available by checking the status register, or the device can be configured to provide a hardware interrupt via the irq pin. there is a repeat mode for the alarm allowing a periodic interrupt ev ery minute, every hour, every day, etc. the device also offers a backup power input pin. this v bat pin allows the device to be backed up by battery or supercap with automatic switchover from v dd to v bat . the entire isl1209 device is fully operational from v dd =2.7v to 5.5v and the clock/calendar por tion of the device remains fully operational in battery backup mode down to 1.8v (standby mode). pin description x1, x2 the x1 and x2 pins are the input and output, respectively, of an inverting amplifier. an external 32.768khz quartz crystal is used with the isl1209 to supply a timebase for the real time clock. internal compensation circuitry provides high accuracy over the operati ng temperature range from -40c to +85c. this oscillat or compensation network can be used to calibrate the crystal timing accuracy over temperature either during manufacturing or with an external temperature sensor and microcontroller for active compensation. the device can also be driven directly from a 32.768khz source at pin x1. v bat this input provides a backup supply voltage to the device. v bat supplies power to the device in the event that the v dd supply fails. this pin can be connected to a battery, a super cap or tied to ground if not used. evin (event input) the evin pin is an input that is used to detect an externally monitored event. when a high signal is present at the evin pin, an ?event? is detected. this input may be used for various monitoring functions, such as the opening of a detection switch on a chassis or door. the event detection circuit can be user enabled or disabled (see even bit) and provides the option to be operational in battery backup modes (see evbatb bit). when the event detection is disabled the evin pin is gated off. see functional description for more details. evdet (event detect output) the evdet is an open drain output which will go low when an event is detected at the evi n pin. if the event detection function is enabled, the evdet output will go low and stay low until the evt bit is cleared (see evin pin description). irq /f out (interrupt output/frequency output) this dual function pin can be used as an interrupt or frequency output pin. the irq /f out mode is selected via the frequency out control bits of the control/status register. ? interrupt mode. the pin provides an interrupt signal output. this signal notifies a host processor that an alarm figure 7. standard output load for testing the device with v dd = 5.0v sda and irq /fout 1533 ? 100pf 5.0v for v ol = 0.4v and i ol = 3ma equivalent ac output load circuit for v dd = 5v figure 8. recommended crystal connection x1 x2 isl1209
8 fn6109.1 september 27, 2005 has occurred and requests action. it is an open drain active low output. ? frequency output mode. the pin outputs a clock signal which is related to the crystal frequency. the frequency output is user selectable and enabled via the i 2 c bus. it is an open drain active low output. serial clock (scl) the scl input is used to clock all serial data into and out of the device. the input buffer on this pin is always active (not gated). it is disabled when the backup power supply on the v bat pin is activated to minimize power consumption. serial data (sda) sda is a bidirectional pin used to transfer data into and out of the device. it has an open drain output and may be ored with other open drain or open co llector outputs. the input buffer is always active (not gated) in normal mode. an open drain output requires the use of a pull-up resistor. the output circuitry controls the fa ll time of the output signal with the use of a slope contro lled pull-down. the circuit is designed for 400khz i 2 c interface speeds. it is disabled when the backup power supply on the v bat pin is activated. v dd , gnd chip power supply and ground pins. the device will operate with a power supply from v dd =2.7v to 5.5vdc. a 0.1f capacitor is recommended on the v dd pin to ground. functional description power control operation the power control circuit accepts a v dd and a v bat input. many types of batteries can be used with intersil rtc products. for example, 3.0v or 3.6v lithium batteries are appropriate, and battery sizes are available that can power the isl1209 for up to 10 years. another option is to use a super cap for applications where v dd is interrupted for up to a month. see the applications section for more information. normal mode (v dd ) to battery backup mode (v bat ) to transition from the v dd to v bat mode, both of the following conditions must be met: condition 1: v dd < v bat - v bathys where v bathys 50mv condition 2: v dd < v trip where v trip 2.2v battery backup mode (v bat ) to normal mode (v dd ) the isl1209 device will switch from the v bat to v dd mode when one of the following conditions occurs: condition 1: v dd > v bat + v bathys where v bathys 50mv condition 2: v dd > v trip + v triphys where v triphys 30mv these power control situations are illustrated in figures 9 and 10. the i 2 c bus is deactivated in battery backup mode to provide lower power. aside from th is, all rtc functions are operational during battery backup mode. except for scl and sda, all the inputs and outputs of the isl1209 are active during battery backup mode unless disabled via the control register. the user sram is operational in battery backup mode down to 1.8v. power failure detection the isl1209 provides a real time clock failure bit (rtcf) to detect total power failure. it allows users to determine if the device has powered up after having lost all power to the device (both v dd and v bat ). low power mode the normal power switching of the isl1209 is designed to switch into battery backup mode only if the v dd power is lost. this will ensure that the device can accept a wide range of backup voltages from many types of sources while reliably switching into backup mode. another mode, called low v bat - v bathys v bat v bat + v bathys battery backup mode v dd v trip 2.2v 1.8v figure 9. battery switchover when v bat < v trip figure 10. battery switchover when v bat > v trip v trip v bat v trip + v triphys battery backup mode v dd v trip 3.0v 2.2v isl1209 ?
9 fn6109.1 september 27, 2005 power mode, is available to allow direct switching from v dd to v bat without requiring v dd to drop below v trip . since the additional monitoring of v dd vs. v trip is no longer needed, that circuitry is shut down and less power is used while operating from v dd . power savings are typically 600na at v dd = 5v. low power mode is activated via the lpmode bit in the contro l and status registers. low power mode is useful in systems where v dd is normally higher than v bat at all times. the dev ice will switch from v dd to v bat when v dd drops below v bat , with about 50mv of hysteresis to prevent any switchback of v dd after switchover. in a system with a v dd = 5v and backup lithium battery of v bat = 3v, low power mode can be used. however, it is not recommended to use low power mode in a system with v dd = 3.3v 10%, v bat 3.0v, and when there is a finite i-r voltage drop in the v dd line. interseal? battery saver the isl1209 has the interseal? battery saver which prevents initial battery current drain before it is first used. for example, battery-backed rt cs are commonly packaged on a board with a battery connected. in order to preserve battery life, the isl1209 will not draw any power from the battery source until after the device is first powered up from the v dd source. thereafter, the device will switchover to battery backup mode whenever v dd power is lost. event/tamper monitor and detection the isl1209 provides an event detection and alarm function to be used in a wide variety of applications ranging from security, warranty monitoring, data collection and recording. the tamper detect input pin, evin, can be used as a event or tamper detection input of an external switch (mechanical or electronic). when the evin pin is a valid high, the isl1209 sets the evt bit in the status register and, can optionally: 1) issue an event output signal (evdet pin), 2) at the time event occurred, stop the rtc registers from advancing. to allow for flexibility of external switches used at the evin pin, the internal pull-up (~1a in full on mode) can be disabled/enabled. this will allow more flexibility depending on the capacitive and resistive loading at the evin pin. a noise filter option is also provided for the event monitor circuit. the evin pin has a time based filter where the evin signal must be stable for a period of time to trigger a valid detection. the time hysteresis f ilter can vary from 0, 3.9ms, 15.2ms or 31.25ms. for low power applications the event monitor can be sampled at a user selectable rate. the evin pin can be always on or periodically sampled with a frequency of 1/4, 1 or 2hz. event detect timing diagram with sampling mode enabled case 1, switched opened before i pu case 2, switched opened after i pu case 3, switched bounced the isl1209 can operate independently or in conjunction with a microcontroller for low power operation modes or in battery backup modes. the event detection circuits operate in either main v dd power or battery backup mode. 8 clks (8x) 15 clks (8x) off on open closed low high high low evdet ev in ext. switch i pu 8 clks (8x) 15 clks (8x) off on open closed low high high low evdet ev in ext. switch i pu 15 clks (8x) off on open closed low high high low evdet ev in ext. switch i pu 8 clks (8x) isl1209
10 fn6109.1 september 27, 2005 users have the option to connect evin (see evineb bit) to an internal pull up current so urce that operates at 1 a (always on mode). user selectable event sampling modes are also available which will effectively reduce power consumption with 1/4-hz, 1-hz and 2-hz sample detection rates. the evin input is pulsed on/off when in sampling mode for power savings advantages (see tables below). the evin also has a user selectable time based hysteresis filter (see ehys bits) to implement switch de-bouncing during an event detection. the evin signal must be high for the duration of the selected time period. the time periods available are 0 times delay ( no time based hysteresis) to 3.9ms, 15.625ms or 31.25ms (see table 1, 2, 3, and 4). real time clock operation the real time clock (rtc) uses an external 32.768khz quartz crystal to maintain an accurate internal representation of second, minute, hour, day of week, date, month, and year. the rtc also has leap-year correction. the clock also corrects for months having fewer than 31 days and has a bit that controls 24 hour or am/pm format. when the isl1209 powers up after the loss of both v dd and v bat , the clock will not begin incrementing until at least one byte is written to the clock register. accuracy of the real time clock the accuracy of the real time clock depends on the frequency of the quartz crystal that is used as the time base for the rtc. since the resonant frequency of a crystal is temperature dependent, the rtc performance will also be dependent upon temperature. the frequency deviation of the crystal is a function of th e turnover temperature of the crystal from the crystal?s nominal frequency. for example, a ~20ppm frequency deviation translates into an accuracy of ~1 minute per month. these parameters are available from the crystal manufacturer. the isl1209 provides on-chip crystal compensation networks to adjust load capacitance to tune oscillator frequency from -94ppm to +140ppm. for more detailed information see the application section. single event and interrupt the alarm mode is enabled via the alme bit. choosing single event or interrupt alarm mode is selected via the im bit. note that when the frequency output function is enabled, the alarm function is disabled. the standard alarm allows for alarms of time, date, day of the week, month, and year. when a time alarm occurs in single event mode, an irq pin will be pulled low and the alarm status bit (alm) will be set to ?1?. the pulsed interrupt mode allows for repetitive or recurring alarm functionality. hence, once the alarm is set, the device will continue to alarm for each occurring match of the alarm and present time. thus, it will alarm as often as every minute (if only the nth second is set) or as infrequently as once a year (if at least the nth month is set). during pulsed interrupt mode, the irq pin will be pulled low for 250ms and the alarm status bit (alm) will be set to ?1?. the alm bit can be reset by the user or cleared automatically using the auto reset mode (see arst bit). the alarm function can be enabled/disabled during battery backup mode using the fobatb bit. for more information on the alarm, please see the alarm registers description. frequency output mode the isl1209 has the option to provide a frequency output signal using the irq /f out pin. the frequency output mode is set by using the fo bits to select 15 possible output frequency values from 0 to 32khz. the frequency output can be enabled/disabled during battery backup mode using the fobatb bit. general purpose user sram the isl1209 provides 2 bytes of user sram. the sram will continue to operate in battery backup mode. however, it should be noted that the i 2 c bus is disabled in battery backup mode. i 2 c serial interface the isl1209 has an i 2 c serial bus interface that provides access to the control and status registers and the user table 1. ? i dd (v dd =3v, t hys =3.9ms) f smp delta i dd 1/4hz 20.5na 1hz 82na 2hz 164na table 2. ? i dd (v dd =5.0v, t hys =3.9ms) f smp delta i dd 1/4hz 65.8na 1hz 263.3na 2hz 526.5na table 3. ? i dd (v dd =3.0v, t hys =15.625ms) f smp delta i dd 1/4hz 82na 1hz 328na 2hz 656.3na table 4. ? i dd (v dd =5.0v, t hys =15.625ms) f smp delta i dd 1/4hz 264na 1hz 1.05a 2hz 2.1a isl1209
11 fn6109.1 september 27, 2005 sram. the i 2 c serial interface is compatible with other industry i 2 c serial bus protocols using a bidirectional data signal (sda) and a clock signal (scl). oscillator compensation the isl1209 provides the option of timing correction due to temperature variation of the crystal oscillator for either manufacturing calibration or ac tive calibration. the total possible compensation is typically -94ppm to +140ppm. two compensation mechanisms that are available are as follows: 1. an analog trimming (atr) register that can be used to adjust individual on-chip digital capacitors for oscillator capacitance trimming. the individual digital capacitor is selectable from a range of 9pf to 40.5pf (based upon 32.758khz). this translates to a calculated compensation of approximately -34ppm to +80ppm. (see atr description.) 2. a digital trimming register (dtr) that can be used to adjust the timing counter by 60ppm. (see dtr description.) also provided is the ability to adjust the crystal capacitance when the isl1209 switches from v dd to battery backup mode. (see battery mode atr selection for more details.) register descriptions the battery-backed registers are accessible following a slave byte of ?1101111x? and reads or writes to addresses [00h:13h]. the defined addresses and default values are described in the table 1. addre ss 09h is not used. reads or writes to 09h will not affect ope ration of the device but should be avoided. register access the contents of the register s can be modified by performing a byte or a page write operation directly to any register address. the registers are divided into 4 sections. these are: 1. real time clock (7 bytes): address 00h to 06h. 2. control and status (5 bytes): address 07h to 0bh. 3. alarm (6 bytes): address 0ch to 11h. 4. user sram (2 bytes): address 12h to 13h. there are no addresses above 13h. write capability is allowable into the rtc registers (00h to 06h) only when the wrtc bit (bit 4 of address 07h) is set to ?1?. a multi-byte read or write operation is limited to one section per operation. access to another section requires a new operation. a read or write can begin at any address within the section. a register can be read by performing a random read at any address at any time. this returns the contents of that register location. additional registers are read by performing a sequential read. for the rtc a nd alarm registers, the read instruction latches all clock r egisters into a buffer, so an update of the clock does not change the time being read. a sequential read will not result in the output of data from the memory array. at the end of a read, the master supplies a stop condition to end the operation and free the bus. after a read, the address remains at t he previous address +1 so the user can execute a current address read and continue reading the next register. it is not necessary to set the wrtc bit prior to writing into the control and status, alarm, and user sram registers. isl1209
12 fn6109.1 september 27, 2005 table 5. register memory map addr. section reg name bit range default 76543210 00h rtc sc 0 sc22 sc21 sc20 sc13 sc12 sc11 sc10 0-59 00h 01h mn 0 mn22 mn21 mn20 mn13 mn12 mn11 mn10 0-59 00h 02h hr mil 0 hr21 hr20 hr13 hr12 hr11 hr10 0-23 00h 03h dt 0 0 dt21 dt20 dt13 dt12 dt11 dt10 1-31 00h 04h mo 0 0 0 mo20 mo13 mo12 mo11 mo10 1-12 00h 05h yr yr23 yr22 yr21 yr20 yr13 yr12 yr11 yr10 0-99 00h 06h dw00000dw2dw1dw00-600h 07h control and status sr arst xtoscb reserved wrtc evt alm bat rtcf n/a 01h 08h int im alme lpmode fobatb fo3 fo2 fo1 fo0 n/a 00h 09h ev evienb evbatb rtchlt even ehys1 ehys0 esmp1 esmp0 n/a 00h 0ah atr bmatr1 bmatr0 atr5 atr4 atr3 atr2 atr1 atr0 n/a 00h 0bh dtr reserved dtr2 dtr1 dtr0 n/a 00h 0ch alarm sca esca asc22 asc21 asc20 asc13 asc12 asc11 asc10 00-59 00h 0dh mna emna amn22 amn21 amn20 amn13 amn12 amn11 amn10 00-59 00h 0eh hra ehra 0 ahr21 ahr20 ahr13 ahr12 ahr11 ahr10 0-23 00h 0fh dta edta 0 adt21 adt20 adt13 adt12 adt11 adt10 1-31 00h 10h moa emoa 0 0 amo20 amo13 amo12 amo11 amo10 1-12 00h 11h dwaedwa0000adw12adw11adw100-600h 12h user usr1 usr17 usr16 usr15 usr14 usr13 usr12 usr11 usr10 n/a 00h 13h usr2 usr27 usr26 usr25 usr24 usr23 usr22 usr21 usr20 n/a 00h isl1209
13 fn6109.1 september 27, 2005 real time clock registers addresses [00h to 06h] rtc registers (sc, mn, hr, dt, mo, yr, dw) these registers depict bcd repr esentations of the time. as such, sc (seconds) and mn (minutes) range from 0 to 59, hr (hour) can either be a 12-hour or 24-hour mode, dt (date) is 1 to 31, mo (month) is 1 to 12, yr (year) is 0 to 99, and dw (day of the week) is 0 to 6. the dw register provides a day of the week status and uses three bits dw2 to dw0 to represent the seven days of the week. the counter advances in the cycle 0-1-2-3-4-5-6-0-1- 2-? the assignment of a numeri cal value to a specific day of the week is arbitrary a nd may be decided by the system software designer. the default value is defined as ?0?. 24 hour time if the mil bit of the hr register is ?1?, the rtc uses a 24- hour format. if the mil bit is ?0?, the rtc uses a 12-hour format and hr21 bit functions as an am/pm indicator with a ?1? representing pm. the clock defaults to 12-hour format time with hr21 = ?0?. leap years leap years add the day february 29 and are defined as those years that are divisible by 4. ye ars divisible by 100 are not leap years, unless they are also divisible by 400. this means that the year 2000 is a leap year, the year 2100 is not. the isl1209 does not correct for the leap year in the year 2100. control and status registers addresses [07h to 0bh] the control and status regist ers consist of the status register, interrupt and alarm register, analog trimming and digital trimming registers. status register (sr) the status register is located in the memory map at address 07h. this is a volatile register that provides either control or status of rtc failur e, battery mode, alarm trigger, event detection, write protecti on of clock counter, crystal oscillator enable and auto reset of status bits. real time clock fail bit (rtcf) this bit is set to a ?1? after a total power failure. this is a read only bit that is set by hardwa re (isl1209 internally) when the device powers up after having lost all power to the device. the bit is set regardless of whether v dd or v bat is applied first. the loss of only one of the supplies does not set the rtcf bit to ?1?. the first valid write to the rtc section after a complete power failure resets the rtcf bit to ?0? (writing one byte is sufficient). battery bit (bat) this bit is set to a ?1? when the device enters battery backup mode. this bit can be reset either manually by the user or automatically reset by enabling the auto-reset bit (see arst bit). a write to this bit in the sr can only set it to ?0?, not ?1?. alarm bit (alm) these bits announce if the alarm matches the real time clock. if there is a match, the re spective bit is set to ?1?. this bit can be manually reset to ?0? by the user or automatically reset by enabling the auto-reset bit (see arst bit). a write to this bit in the sr can only set it to ?0?, not ?1?. note: an alarm bit that is set by an alarm occurring during an sr read operation will remain set after the read operation is complete. event detect bit (evt) the event detect bit indicates status of the event input pin (evin). when the evin pin is triggered, the evt bit is set to ?1? to indicate a detection of an event input. this bit can be reset by enabling the auto-reset bit (see arst bit). a write to this bit in the sr can only set it to ?0? not ?1?. when a high signal is present at the evin pin, an ?event? is detected. on detection a corresponding bit in the status register (evt bit) is set high and the open drain evdet pin is asserted (pulled low). write rtc enable bit (wrtc) the wrtc bit enables or disables write capability into the rtc timing registers. the factory default setting of this bit is ?0?. upon initialization or power up, the wrtc must be set to ?1? to enable the rtc. upon the completion of a valid write (stop), the rtc starts counting. the rtc internal 1hz signal is synchronized to the stop condition during a valid write cycle. crystal oscillator enable bit (xtoscb) this bit enables/disables the internal crystal oscillator. when the xtoscb is set to ?1?, the oscillator is disabled, and the x1 pin allows for an external 32khz signal to drive the rtc. the xtoscb bit is set to ?0? on power up. auto reset enable bit (arst) this bit enables/disables the aut omatic reset of the bat and alm status bits only. when ar st bit is set to ?1?, these status bits are reset to ?0? after a valid read of the respective status register (with a valid stop condition). when the table 6. status register (sr) addr 7 6 5 4 3 2 1 0 07h arst xtoscb reserved wrtc evt alm bat rtcf default 00 000000 isl1209
14 fn6109.1 september 27, 2005 arst is cleared to ?0?, the user must manually reset the bat and alm bits. interrupt control register (int) frequency out control bits (fo <3:0>) these bits enable/disable the frequency output function and select the output frequency at the irq /f out pin. see table 8 for frequency selection. when the frequency mode is enabled, it will override the alarm mode at the irq /f out pin. frequency output and interrupt bit (fobatb) this bit enables/disables the f out /irq pin during battery backup mode (i.e. v bat power source active). when the fobatb is set to ?1? the f out /irq pin is disabled during battery backup mode. this means that both the frequency output and alarm output func tions are disabled. when the fobatb is cleared to ?0?, the f out /irq pin is enabled during battery backup mode. low power mode bit (lpmode) this bit enables/disables low power mode. with lpmode = ?0?, the device will be in normal mode and the v bat supply will be used when v dd < v bat - v bathys and v dd < v trip . with lpmode = ?1?, the device will be in low power mode and the v bat supply will be used when v dd < v bat -v bathys . there is a supply current saving of about 600na when using lpmode = ?1? with v dd = 5v. (see typical performance curves: i dd vs vdd with lpmode on & off.) alarm enable bit (alme) this bit enables/disables the alarm function. when the alme bit is set to ?1?, the alarm function is enabled. when the alme is cleared to ?0?, the alarm function is disabled. the alarm function can operate in either a single event alarm or a periodic interrupt alarm (see im bit). note: when the frequency output mode is enabled, the alarm function is disabled. interrupt/alarm mode bit (im) this bit enables/disables the interrupt mode of the alarm function. when the im bit is set to ?1?, the alarm will operate in the interrupt mode, where an active low pulse width of 250ms will appear at the irq /f out pin when the rtc is triggered by the alarm as defined by the alarm registers (0ch to 11h). when the im bit is cleared to ?0?, the alarm will operate in standard mode, where the irq /f out pin will be tied low until the alm status bit is cleared to ?0?. event detection register (ev) the isl1209 provides an easy to use event and tamper detection circuit. the event detection register configures the functionality of the ev ent detection circuits. event input sampling selection bits (esmp<1:0>) these two bits select the rate of sampling of the evin pin to trigger an event detection. for example, a 2hz sampling rate would configure the isl1209 to check the status of the ev pin twice a second. slower sa mpling significantly reduces the supply current drain. note: in order to use the sampli ng mode time-based hysteresis must be activated. see table 11. table 7. interrupt control register (int) addr7 6 5 4 3210 08h im alme lpmode fobatb fo3 fo2 fo1 fo0 default0 0 0 0 0000 table 8. frequency selection of f out pin frequency, f out units fo3 fo2 fo1 fo0 0 hz0 000 32768 hz 0 0 0 1 4096 hz 0 0 1 0 1024 hz 0 0 1 1 64 hz0 100 32 hz0 101 16 hz0 110 8 hz0 111 4 hz1 000 2 hz1 001 1 hz1 010 1/2 hz1 011 1/4 hz1 100 1/8 hz1 101 1/16 hz 1 1 1 0 1/32 hz 1 1 1 1 table 9. im bit interrupt/alarm frequency 0 single time event set by alarm 1 repetitive/recurring time event set by alarm table 10. esmp1 esmp0 event sampling rate 00 always on 01 2hz 10 1hz 11 1 / 4 hz isl1209
15 fn6109.1 september 27, 2005 event input time base hysteresis selection bits (ehys<1:0>) these two bits select the time base hysteresis of the evin pin to filter bouncing or noise of external event detection circuits. the time filter can be set between 0 to 31.25 ms. event detect enable bit (even) this bit enables/disables the event detect function of the isl1209. when this bit is set to ?1?, the event detect is active. when this bit is cleared to ?0?, the event detect is disabled. rtc halt on event detect bit (rtchlt) this bit sets the rtc registers to continue or halt counting upon an event detect triggered by the ev pin. the time keeping function will cease when rtchlt is set to ?1?, the rtc will discontinue incrementing if an event is detected. counting will resume when there is a valid write to the to the rtc registers (i.e. time set). the rtchlt is cleared to ?0? after the write to the rtc registers. note: this function requires that the event detection is enabled (see even bit). event output in battery mode enable bit (evbatb) this bit enables/disables the evdet pin during battery backup mode (i.e. v bat pin supply on). when the evbatb is set to ?1?, the event detect output is disabled in battery backup mode. when the evbatb is cleared to ?0?, the event detect output is enabled in battery backup mode.this feature can be used to save power during battery mode. event current source enable bit (evienb) this bit enables/disables the internal pullup current source used for the evin pin. when the evienb bit is set to ?1?, the pullup current source is alwa ys disabled. when the evienb bit is cleared to ?0?, the pullup current source is enabled (current source is approximately 1a). analog trimming register analog trimming register (atr<5:0>) six analog trimming bits, atr0 to atr5 , are provided in order to adjust the on-chip load capacitance value for frequency compensation of the rtc. each bit has a different weight for capacitance adjustm ent. for example, using a citizen cfs-206 crystal with di fferent atr bit combinations provides an estimated ppm adj ustment range from -34 to +80ppm to the nominal frequency compensation. the combination of analog and digital trimming can give up to -94 to +140ppm of total adjustment. the effective on-chip series load capacitance, c load , ranges from 4.5pf to 20.25pf with a mid-scale value of 12.5pf (default). c load is changed via two digitally controlled capacitors, c x1 and c x2 , connected from the x1 and x2 pins to ground (see figure 11). the value of c x1 and c x2 is given by the following formula: the effective series load capaci tance is the combination of c x1 and c x2 : for example, c load (atr=00000) = 12.5pf, c load (atr=100000) = 4.5pf, and c load (atr=011111) = 20.25pf. the entire range for the series combination of load capacitance goes from 4.5pf to 20.25pf in 0.25pf steps. note that these are typical values. battery mode atr selection (bmatr <1:0>) since the accuracy of the crystal oscillator is dependent on the v dd /v bat operation, the isl1209 provides the capability to adjust the capacitance between v dd and v bat when the device switches between power sources. table 11. ehys1 ehys0 time base hysteresis 0 0 0 (pullup always on) 0 1 3.9ms 1 0 15.625ms 1 1 31.25ms table 12. bmatr1 bmatr0 delta capacitance (c bat to c vdd ) 0 0 0pf 0 1 -0.5pf ( +2ppm) 1 0 +0.5pf ( -2ppm) 1 1 +1pf ( -4ppm) figure 11. diagram of atr c x1 x1 x2 crystal oscillator c x2 c x 16 b5 ? 8b4 4b3 2b2 1b1 0.5b0 9 + ? + ? + ? + ? + ? + () pf = c load 1 1 c x1 ---------- - 1 c x2 ---------- - + ?? ?? ---------------------------------- - = c load 16 b5 ? 8 b4 4 b3 2 b2 1 b1 0.5 b0 9 + ? + ? + ? + ? + ? + 2 ----------------------------------------------------------------------------------------------------------------------------- ?? ?? pf = isl1209
16 fn6109.1 september 27, 2005 digital trimming register (dtr <2:0>) the digital trimming bits dtr0, dtr1, and dtr2 adjust the average number of counts per second and average the ppm error to achieve better accuracy. ? dtr2 is a sign bit. dtr2 = ?0? means frequency compensation is >0. dtr2 = ?1? means frequency compensation is <0. ? dtr1 and dtr0 are both scale bits. dtr1 gives 40ppm adjustment and dtr0 gives 20ppm adjustment. a range from -60ppm to +60ppm can be represented by using these three bits (see table 13). alarm registers addresses [0ch to 11h] the alarm register bytes are set up identical to the rtc register bytes, except that th e msb of each byte functions as an enable bit (enable = ?1?). these enable bits specify which alarm registers (seconds, minu tes, etc.) are used to make the comparison. note that there is no alarm byte for year. the alarm function works as a comparison between the alarm registers and the rtc registers. as the rtc advances, the alarm will be triggered once a match occurs between the alarm registers an d the rtc registers. any one alarm register, multiple registers, or all registers can be enabled for a match. there are two alarm operation modes: single event and periodic interrupt mode: ? single event mode is enabled by setting the alme bit to ?1?, the im bit to ?0?, and disabling the frequency output. this mode permits a one-time match between the alarm registers and the rtc register s. once this match occurs, the alm bit is set to ?1? and the irq output will be pulled low and will remain low until the alm bit is reset. this can be done manually or by usi ng the auto-reset feature. ? interrupt mode is enabled by setting the alme bit to ?1?, the im bit to ?1?, and disabling the frequency output. the irq output will now be pulsed each time an alarm occurs. this means that once the inte rrupt mode alarm is set, it will continue to alarm for each occurring match of the alarm and present time. this mode is convenient for hourly or daily hardware interrupts in microcontroller applications such as security cameras or utility meter reading. to clear an alarm, the alm bit in the status register must be set to ?0? with a write. note that if the arst bit is set to 1 (address 07h, bit 7), the alm bit will automatically be cleared when the status register is read. below are examples of both single event and periodic interrupt mode alarms. example 1 ? alarm set with single interrupt (im=?0?) a single alarm will occur on january 1 at 11:30am. a. set alarm registers as follows: b. also the alme bit must be set as follows: xx indicate othe r control bits after these registers are set, an alarm will be generated when the rtc advances to exactly 11:30am on january 1 (after seconds changes from 59 to 00) by setting the alm bit in the status register to ?1? and also bringing the irq output low. example 2 ? pulsed interrupt once per minute (im=?1?) interrupts at one minute intervals when the seconds register is at 30 seconds. a. set alarm registers as follows: b. set the interrupt register as follows: xx indicate othe r control bits table 13. digital trimming registers dtr register estimated frequency ppm dtr2 dtr1 dtr0 0 0 0 0 (default) 001 +20 010 +40 011 +60 100 0 101 -20 110 -40 111 -60 alarm register bit description 76543210hex sca 00000000 00hsec onds disabled mna 10110000 b0hminutes set to 30, enabled hra 10010001 91hhours set to 11, enabled dta 10000001 81hdate set to 1, enabled moa 10000001 81hmonth set to 1, enabled dwa 00000000 00hday of week disabled control register bit description 76543210hex int 01xx0000 x0he nable alarm isl1209
17 fn6109.1 september 27, 2005 once the registers are set, the following waveform will be seen at irq-: note that the status register alm bit will be set each time the alarm is triggered, but does not need to be read or cleared. user registers addresses [12h to 13h] these registers are 2 bytes of battery-backed user memory storage. i 2 c serial interface the isl1209 supports a bidire ctional bus oriented protocol. the protocol defines any devic e that sends data onto the bus as a transmitter and the receiving device as the receiver. the device controlling the transfer is the master and the device being controlled is the slave. the master always initiates data transfers and provides the clock for both transmit and receive operat ions. therefore, the isl1209 operates as a slave device in all applications. all communication over the i 2 c interface is conducted by sending the msb of each byte of data first. protocol conventions data states on the sda line can change only during scl low periods. sda state changes during scl high are reserved for indicating start and stop conditions (see figure 12). on power up of the isl1209, the sda pin is in the input mode. all i 2 c interface operations must begin with a start condition, which is a high to low transition of sda while scl is high. the isl1209 continuously monitors the sda and scl lines for the start condition and does not respond to any command until this condition is met (see figure 12). a start condition is ignored during the power- up sequence. all i 2 c interface operations must be terminated by a stop condition, which is a low to high transition of sda while scl is high (see figure 12). a stop condition at the end of a read operation or at the end of a write operation to memory only places the device in its standby mode. an acknowledge (ack) is a software convention used to indicate a successful data transfer. the transmitting device, either master or slave, releases the sda bus after transmitting eight bits. during the ninth clock cycle, the receiver pulls the sda line low to acknowledge the reception of the eight bits of data (see figure 13). the isl1209 responds with an ack after recognition of a start condition followed by a valid identification byte, and once again after successful rece ipt of an address byte. the isl1209 also responds with an ack after receiving a data byte of a write operation. th e master must respond with an ack after receiving a data byte of a read operation. alarm register bit description 76543210hex sca 10110000b0hseconds set to 30, enabled mna 00000000 00hminutes disabled hra 00000000 00hhours disabled dta 00000000 00hdate disabled moa 00000000 00hmonth disabled dwa 00000000 00hday of week disabled control register bit description 76543210hex int 11xx0000 x0he nable alarm and int mode 60 sec rtc and alarm registers are both ?30? sec isl1209
18 fn6109.1 september 27, 2005 figure 12. valid data changes, start, and stop conditions figure 13. acknowledge response from receiver figure 14. byte write sequence sda scl start data data stop stable change data stable sda output from transmitter sda output from receiver 8 1 9 start ack scl from master high impedance high impedance s t a r t s t o p identification byte data byte a c k signals from the master signals from the isl1209 a c k 10 0 11 a c k write signal at sda 0000 111 address byte isl1209
19 fn6109.1 september 27, 2005 device addressing following a start condition, the master must output a slave address byte. the 7 msbs are the device identifier. these bits are ?1101111?. slave bits ?1101? access the register. slave bits ?111? specify the device select bits. the last bit of the slave address byte defines a read or write operation to be performed. when this r/w bit is a ?1?, then a read operation is selected. a ?0? selects a write operation (refer to figure 15). after loading the entire slave address byte from the sda bus, the isl1209 compares the device identifier and device select bits with ?1101111?. upon a correct compare, the device outputs an acknowledge on the sda line. following the slave byte is a one byte word address. the word address is either supplied by the master device or obtained from an internal counter. on power up the internal address counter is set to addr ess 0h, so a current address read of the ccr array starts at address 0h. when required, as part of a random read, the master must supply the 1 word address bytes as shown in figure 16. in a random read operation, t he slave byte in the ?dummy write? portion must match t he slave byte in the ?read? section. for a random read of the clock/control registers, the slave byte must be ?1101111x? in both places. write operation a write operation requires a star t condition, followed by a valid identification byte, a valid address byte, a data byte, and a stop condition. after each of the three bytes, the isl1209 responds with an ack. at this time, the i 2 c interface enters a standby state. read operation a read operation consists of a three byte instruction followed by one or more data bytes (see figure 16). the master initiates the operation issuing the following sequence: a start, the identification byte with the r/w bit set to ?0?, an address byte, a second start, and a second identification byte with the r/w bit set to ?1?. after each of the three bytes, the isl1209 re sponds with an ack. then the isl1209 transmits data by tes as long as the master responds with an ack during the scl cycle following the eighth bit of each byte. the master terminates the read operation (issuing a stop condit ion) following the last bit of the last data byte (see figure 16). the data bytes are from the memory location indicated by an internal pointer. this pointer initial value is determined by the address byte in the read operation instruction, and increments by one during transmission of each data byte. after reaching the memory location 13h the pointer ?rolls over? to 00h, and the device continues to output data for each ack received. figure 15. slave address, word address, and data bytes slave address byte d7 d6 d5 d2 d4 d3 d1 d0 a0 a7 a2 a4 a3 a1 data byte a6 a5 1 10 1 1 1 r/w 1 word address figure 16. read sequence signals from the master signals from the slave signal at sda s t a r t identification byte with r/w =0 address byte a c k a c k 0 s t o p a c k 1 identification byte with r/w = 1 a c k s t a r t last read data byte first read data byte a c k 10 1 1111 10 1 11 11 isl1209
20 fn6109.1 september 27, 2005 application section event detection the event detection f eature of the isl1209 is intended to be used for recording the time of single events that involve the opening of an enclosure, door, etc. the normal method of detection is with normally clos ed switch function that opens to initiate the event. this mech anism is ideal for applications such as set top boxes, utility meters, security alarm and camera systems or vending machines. a typical application diagram is shown in figure 17. a microcontroller communicates with the isl1209 through the i 2 c serial bus, to set up and read time of the day, alarms, or set up the outputs frequency control. a general purpose i/o pin can be used to monitor the isl1209?s evdet-pin and take action. options include waking up the microcontroller to proceed with an activity, or simply logging the time of the event in memory. an additional event action available in the isl1209 is to stop the real time clock from advancing. if the event register is set to enable this function (register 09h, rtchlt bit 5 set to 1), then when the evin pin is triggered, the clock counters will stop and hold the time of the event. this is useful for one time occurrences such as opening a warranted consumer product enclosure or exceed ing a maximum temperature inside a device. once the clock is stopped, the clock registers must be written with an updated time, then they will begin advancing immediately. if the rtchlt bit is still set, then the next event will again stop the clock. event detect input details the evin input is a schmitt trigger logic input. an event is detected when it is asserted high. the isl1209 device has internal configuration settings which add detection flexibility. there are four configuration bits in register 09h which are for evin sampling. the esmp1 and esmp0 bits control sampling of the event input status. reducing the sampling rate will lower the supply current drain, with the tradeoff of adding a delay in detecting an event. an event that is long in duration (i.e. opening a door) would obviously be served well with the lowest frequency sampling rate and lowest supply current drain. the ehys1 and ehys0 bits control timer circuits to filter out switch bouncing, noise or intermittent contacts, by effectively adding time-based hysteresis to the evin input. they are used only in conjunction with the sampling rate, they cannot be used alone. the most appr opriate use for the hysteresis function is for glitch or noi se filtering on the evin input signal. battery backup details the event detection function has been designed to minimize power drain for extended life in battery backed applications. many applications will need detection while in battery backup. another bit, the evbatb bit, is used to control if the event input is active in battery backup mode. note that to disable event sampling in battery backup, this bit is set to 1. the occurrence of an event is recorded and can be read by the microprocessor the next time the circuit is powered up. the input current sources and sampling are also usable in battery backup mode. if the evienb bit is set to disable the input current source, a larg e value pullup resistor must p0 p2 p4 p1 p3 p5 scl sda x1 x2 v bat v dd evin vcc irq/f scl sda evdet isl1209 micro c. event detect switch normally closed v cc 5.1k 5.1k 1m** 2m* 3.0v 32.768khz source * optional pull up resistors, or use internal current ** the pull up resistor on the evdet-output can vary from 10k up to 10m or more, depending on the application 10 9 8 7 6 1 2 3 4 5 figure 17. isl1209
21 fn6109.1 september 27, 2005 be tied to the v bat input to allow event detection in battery backup. note that any input signal conditioning circuitry that is added in regular operation or battery backup should have minimum supply current drain, or have t he capability to be put in a low power standby mode. op amps such as the el8176 have low normal supply current (50a) and standby power drain (3a ) , so can be used in battery backup applications oscillator crys tal requirements the isl1209 uses a standard 32.768khz crystal. either through hole or surface mount crystals can be used. table 14 lists some recommended surface mount crystals and the parameters of each. this list is not exhaustive and other surface mount devices can be used with the isl1209 if their specifications are very similar to the devices listed. the crystal should have a required parallel load capacitance of 12.5pf and an equivalent series resistance of less than 50k. the crystal?s temperature range specification should match the application. many crystals are rated for -10c to +60c (especially through hole and tuning fork types), so an appropriate crystal should be selected if extended temperature range is required. crystal oscillator frequency adjustment the isl1209 device contains circuitry for adjusting the frequency of the crystal oscillator. this circuitry can be used to trim oscillator initial accuracy as well as adjust the frequency to compensate for temperature changes. the analog trimming register (atr) is used to adjust the load capacitance seen by the crystal. there are six bits of atr control, with linear capacitance increments available for adjustment. since the atr adjust ment is essentially ?pulling? the frequency of the oscillator, the resulting frequency changes will not be linear with incremental capacitance changes. the equations whic h govern pulling show that lower capacitor values of atr adjustment will provide larger increments. also, the higher values of atr adjustment will produce smaller incremental frequency changes. these values typically vary from 6-10 ppm/bit at the low end to <1ppm/bit at the highest capacitance settings. the range afforded by the atr adjustment with a typical surface mount crystal is typically -34 to +80ppm around the atr=0 default setting because of this property. the user should note this when using the atr for calibration. the temperature drift of the capacitance used in the atr control is extremely low, so this feature can be used for te mperature compensation with good accuracy. in addition to the analog compensation afforded by the adjustable load capacitance, a digital compensation feature is available for the isl1209. there are 3 bits known as the digital trimming register (dtr). the range provided is 60ppm in increments of 20ppm. dtr operates by adding or skipping pulses in the clock counter. it is very useful for coarse adjustments of frequency drift over temperature or extending the adjustment ra nge available with the atr register. initial accuracy is best adjusted by enabling the frequency output (using the int register, address 08h), and monitoring the ~irq /f out pin with a calibrated frequency counter. the frequency used is unimportant, although 1hz is the easiest to monitor. the gating time should be set long enough to ensure accuracy to at least 1ppm. the atr should be set to the center position, or 100000bh, to begin with. once the initial measur ement is made, then the atr register can be changed to adjust the frequency. note that increasing the atr register for increased capacitance will lower the frequency, and vice-versa. if the initial measurement shows the frequency is far off, it will be necessary to use the dtr register to do a coarse adjustment. note that most all crystals will have tight enough initial accuracy at room temperature so that a small atr register adjustment should be all that is needed. temperature compensation the atr and dtr controls can be combined to provide crystal drift temperature compensation. the typical 32.768khz crystal has a drift char acteristic that is similar to that shown in figure 18. ther e is a turnover temperature (t 0 ) where the drift is very near zero. the shape is parabolic as it varies with the square of the difference between the actual temperature and t he turnover temperature. table 14. suggested surface mount crystals manufacturer part number citizen cm200s epson mc-405, mc-406 raltron rsm-200s saronix 32s12 ecliptek ecpsm29t-32.768k ecs ecx-306 fox fsm-327 temperature (c) -160.0 -140.0 -120.0 -100.0 -80.0 -60.0 -40.0 -20.0 0.0 -40-30-20-100 1020304050607080 ppm figure 18. rtc crystal temperature drift isl1209
22 fn6109.1 september 27, 2005 if full industrial temperature compensation is desired in an isl1209 circuit, then both the dtr and atr registers will need to be utilized (total correction range = -94 to +140ppm). a system to implement temp erature compensation would consist of the isl1209, a temperature sensor, and a microcontroller. these devices may already be in the system so the function will just be a matter of implementing software and performing some calculations. fairly accurate temperature compensation can be implemented just by using the crystal manufacture r?s specifications for the turnover temperature t 0 and the drift coefficient ( ). the formula for calculating the oscillator adjustment necessary is: adjustment (ppm) = (t ? t 0 ) 2 * once the temperature curve for a crystal is established, then the designer should decide at what discrete temperatures the compensation will change. since drift is higher at extreme temperatures, the compensation may not be needed until the temperature is greater than 20c from t 0 . a sample curve of the atr sett ing vs. frequency adjustment for the isl1209 and a typical rtc crystal is given in figure 19. this curve may vary with different crystals, so it is good practice to evaluate a given crystal in an isl1209 circuit before establishing the adjustment values. this curve is then used to figure what atr and dtr settings are used for compensation. the results would be placed in a lookup table for the microcontroller to access. layout considerations the crystal input at x1 has a very high impedance, and oscillator circuits operati ng at low frequencies such as 32.768khz are known to pick up noi se very easily if layout precautions are not followed. most instances of erratic clocking or large accuracy errors can be traced to the susceptibility of the oscillator circuit to interference from adjacent high speed clock or data lines. careful layout of the rtc circuit will avoid noise pickup and insure accurate clocking. figure 20 shows a suggested layout for the isl1209 device using a surface mount crystal. two main precautions should be followed: do not run the serial bus lines or any high speed logic lines in the vicinity of the crystal . these logic level lines can induce noise in the oscillator circuit to cause misclocking. add a ground trace around the crystal with one end terminated at the chip ground. this will provide termination for emitted noise in the vicinity of the rtc device. in addition, it is a good idea to avoid a ground plane under the x1 and x2 pins and the crystal, as this will affect the load capacitance and therefore the oscillator accuracy of the circuit. if the ~irq/f out pin is used as a clock, it should be routed away from the rtc device as well. the traces for the v bat and vdd pins can be treat ed as a ground, and should be routed around the crystal. super capacitor backup the isl1209 device provides a v bat pin which is used for a battery backup input. a super capacitor can be used as an alternative to a battery in cases where shorter backup times are required. since the batt ery backup supply current required by the isl1209 is extremel y low, it is possible to get months of backup operation using a super capacitor. typical capacitor values are a few f to 1 farad or more depending on the application. if backup is only needed for a few minutes, then a small inexpensive electrolytic capacitor can be used. for extended periods, a low leakage, high capacity super capacitor is the best choice. these devices are available from such vendors as panasonic and murata. the main specifications include working voltage and leakage current. if the application is for charging the capacitor from a +5v 5% supply with a signal diode, then the voltage on the capacitor can vary from ~4.5v to slightly over 5.0v. a capacitor with a rated wv of 5.0v may have a reduced lifetime if th e supply voltage is slightly high. the leakage current should be as small as possible. for example, a super capacitor should be specified with leakage of well below 1a. a standard electrolytic capacitor with dc leakage current in the microamps will have a severely shortened backup time. -40.0 -30.0 -20.0 -10.0 0.0 10.0 20.0 30.0 40.0 50.0 60.0 70.0 80.0 90.0 0 5 10 15 20 25 30 35 40 45 50 55 60 atr setting ppm adjustment figure 19. atr setting vs oscillator frequency adjustment figure 20. suggested layout for isl1209 and crystal isl1209
23 fn6109.1 september 27, 2005 below are some examples with equations to assist with calculating backup times and required capacitance for the isl1209 device. the backup supply current plays a major part in these equations, and a typical value was chosen for example purposes. for a robust design, a margin of 30% should be included to cover supply current and capacitance tolerances over the results of the calculations. even more margin should be included if periods of very warm temperature operat ion are expected. example 1. calculating backup time given voltages and capacitor value in figure 21, use c bat = 0.47f and vdd = 5.0v. with v dd = 5.0v, the voltage at v bat will approach 4.7v as the diode turns off completely. the isl1209 is specified to operate down to v bat = 1.8v. the capacitance charge/discharge equation is used to estimate the total backup time: rearranging gives c bat is the backup capacitance and dv is the change in voltage from fully charged to loss of operation. note that i tot is the total of the supply current of the isl1209 (i bat ) plus the leakage current of the capacitor and the diode, i lkg . in these calculations, i lkg is assumed to be extremely small and will be ignored. if an application requires extended operation at temperatures over 50c, these leakages will increase and hence reduce backup time. note that i bat changes with v bat almost linearly (see typical performance curves). this allows us to make an approximation of i bat , using a value midway between the two endpoints. the typical linear equation for i bat vs. v bat is: using this equation to solve for the average current given 2 voltage points gives: combining with equation 2 gives the equation for backup time: where c bat = 0.47f v bat2 = 4.7v v bat1 = 1.8v i lkg = 0 (assumed minimal) solving equation 4 for this example, i batavg = 4.387e-7 a t backup = 0.47 * (2.9) / 4.38e-7 = 3.107e6 sec since there are 86,400 seconds in a day, this corresponds to 35.96 days. if the 30% tolerance is included for capacitor and supply current tolerances, then worst case backup time would be: c bat = 0.70 * 35.96 = 25.2 days example 2. calculating a capacitor value for a given backup time referring to figure 21 again, the capacitor value needs to be calculated to give 2 months ( 60 days) of backup time, given vdd = 5.0v. as in example 1, the v bat voltage will vary from 4.7v down to 1.8v. we will need to rearrange equation 2 to solve for capacitance: using the terms described above, this equation becomes: where t backup = 60 days * 86,400 sec/day = 5.18 e6 sec i batavg = 4.387 e-7 a (same as example 1) i lkg = 0 (assumed) v bat2 = 4.7v v bat1 = 1.8v solving gives c bat = 5.18 e6 * (4.387 e-7)/(2.9) = 0.784f if the 30% tolerance is included for tolerances, then worst case cap value would be c bat = 1.3 *.784 = 1.02f figure 21. supercapacitor charging circuit 2.7v to 5.5v vdd v bat gnd 1n4148 c bat i = c bat * dv/dt (eq. 1) dt = c bat * dv/i tot to solve for backup time. (eq. 2) i bat = 1.031e-7*(v bat ) + 1.036e-7 amps (eq. 3) i batavg = 5.155e-8*(v bat2 + v bat1 ) + 1.036e-7 amps (eq. 4) t backup = c bat * (v bat2 - v bat1 ) / (i batavg + i lkg ) (eq. 5) seconds c bat = dt*i/dv (eq. 6) c bat = t backup * (i batavg + i lkg )/(v bat2 ? v bat1 ) (eq. 7) isl1209
24 all intersil u.s. products are manufactured, asse mbled and tested utilizing iso9000 quality systems. intersil corporation?s quality certifications ca n be viewed at www.intersil.com/design/quality intersil products are sold by description only. intersil corpor ation reserves the right to make changes in circuit design, soft ware and/or specifications at any time without notice. accordingly, the reader is cautioned to verify that data sheets are current before placing orders. information furnishe d by intersil is believed to be accurate and reliable. however, no responsibility is assumed by intersil or its subsidiaries for its use; nor for any infringements of paten ts or other rights of third parties which may result from its use. no license is granted by implication or otherwise under any patent or patent rights of intersil or its subsidiari es. for information regarding intersil corporation and its products, see www.intersil.com fn6109.1 september 27, 2005 mini small outline pl astic packages (msop) notes: 1. these package dimensions are wi thin allowable dimensions of jedec mo-187ba. 2. dimensioning and tolerancing per ansi y14.5m - 1994. 3. dimension ?d? does not include mold flash, protrusions or gate burrs and are measured at datum plane. mold flash, protrusion and gate burrs shall not exceed 0.15mm (0.006 inch) per side. 4. dimension ?e1? does not includ e interlead flash or protrusions and are measured at datum plane. interlead flash and protrusions shall not exceed 0.15mm (0.006 inch) per side. 5. formed leads shall be planar wi th respect to one another within 0.10mm (.004) at seating plane. 6. ?l? is the length of terminal for soldering to a substrate. 7. ?n? is the number of terminal positions. 8. terminal numbers are shown for reference only. 9. dimension ?b? does not include dambar protrusion. allowable dambar protrusion shall be 0.08mm (0.003 inch) total in excess of ?b? dimension at maximum ma terial condition. minimum space between protrusion and adjacent lead is 0.07mm (0.0027 inch). 10. datums and to be determined at datum plane . 11. controlling dimension: millimeter. converted inch dimen- sions are for reference only l 0.25 (0.010) l1 r1 r 4x 4x gauge plane seating plane e e1 n 12 top view index area -c- -b- 0.20 (0.008) a b c seating plane 0.20 (0.008) c 0.10 (0.004) c -a- -h- side view b e d a a1 a2 -b- end view 0.20 (0.008) c d e 1 c l c a - h - -a - - b - - h - m10.118 (jedec mo-187ba) 10 lead mini small outline plastic package symbol inches millimeters notes min max min max a 0.037 0.043 0.94 1.10 - a1 0.002 0.006 0.05 0.15 - a2 0.030 0.037 0.75 0.95 - b 0.007 0.011 0.18 0.27 9 c 0.004 0.008 0.09 0.20 - d 0.116 0.120 2.95 3.05 3 e1 0.116 0.120 2.95 3.05 4 e 0.020 bsc 0.50 bsc - e 0.187 0.199 4.75 5.05 - l 0.016 0.028 0.40 0.70 6 l1 0.037 ref 0.95 ref - n10 107 r 0.003 - 0.07 - - r1 0.003 - 0.07 - - 5 o 15 o 5 o 15 o - 0 o 6 o 0 o 6 o - rev. 0 12/02 isl1209

▲Up To Search▲

Price & Availability of ISL1209IU10Z-TK

	To Download ISL1209IU10Z-TK Datasheet File
If you can't view the Datasheet, Please click here to try to view without PDF Reader .